Materials Characterization Center
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Materials Characterization Center |
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Facilities Included in MC2 are the Transmission Electron Microscopy (TEM) Facility, Scanning Electron Microscopy (SEM) Facility, Light Optical Microscopy (LOM) Facility and X-Ray Diffraction (XRD) Facility. The TEM Facility contains a FEI/Philips CM-20 conventional TEM equipped with an EDAX EDS system. The SEM Facility contains a Schottky thermal field emission FEI/Philips XL-30 SEM equipped with back scattered electron detector and energy-dispersive X-ray spectometer (EDS). The LOM Facility includes two Nikon Epiphot microscopes for reflect light microscopy, and one Nikon Optiphto-Pol for transmitted and polarized light microscopy. All of these microscopes can be connected to the Olympus digital camera and the SIS image analysis system. The facility is also equipped with a UMAX PowerLook 3000 high resolution scanner that has the capability to scan either negative or positive images. The XRD Facility contains a Siemens/Bruker D-5000 powder diffractometer equipped with modern software for qualitative and semi-quantitative analyses. In addition, the Center also equipped with a specimen preparation facility and a dark room facility. The following list summarizes the instruments and equipment currently available at the Center. Regulations for reservations are listed in the Center Rules. User wishes to use the facility need to complete the application form and obtain approval by his/her advisor and the Center director. Instrumentation Electron Microscopy Facility Electron Microscopy Sample Preparation
Facility X-Ray Diffraction Facility Optical Microscopy Facility Dark Room Facility |
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